Description

Transmission Electron Microscopy (TEM)  is a microscopy technique operates very similar to an optical microscope, except that it uses a beam of electrons, transmits through an ultra-thin specimen, interacting with the specimen as it passes through. The required image is then formed by the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device and is detected by a sensor or camera. The greatest consideration when performing TEM analysis is sample preparation that will decide if the micrograph will be good or not. Sample Preparation is discussed under another chapter…Click here.

TEM is a very useful technique for: